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Crystals | Free Full-Text | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti
A schematic representation of the measurement of the Debye – Scherrer... | Download Scientific Diagram
IUCr) Improvement in X-ray stress measurement using Debye–Scherrer rings by in-plane averaging
Half of the Debye-Scherrer rings showing some identified... | Download Scientific Diagram
scattering - Why does the Debye-Scherrer procedure work (powder diffractometer) - Physics Stack Exchange
Debye-Scherrer rings of a textured Ti with two texture components (ϕ 1... | Download Scientific Diagram